In-Situ Deposition, Optical Characterization and Bandgap Shift of AgO Thin Films

Abstract

Porous and specularly reflective films of inorganic silver oxide (AgO) with thickness ranging from 275-435nm have been deposited by chemical bath (CBD) in a mixed solution of silver nitrate AgNO₃ and precursor of triethanolamine (TEA) maintained at a temperature of 318K. Surface morphology of the films was characterized by scanning electron microscopy (SEM). Optical and structural studies were performed to find the optical attenuation, some solid state properties and crystallographic structure for the individual films. High quality films with low transmittance < 11.50% in the visible and near infrared (NIR) region are obtained. Direct optical bandgap for the films lies in the range 1.5-1.7eV, whereas the refractive index developed peak in the dispersion region near 450nm. X-ray diffraction study indicates that the films composed of polycrystalline AgO with cubic structure belonging to the space group, fm3m.

Keywords: Inorganic silver oxide, Triethanolamine (TEA), X-ray diffraction, Transmittance.