Synthesis and Structural Properties of Nanocrystalline (Pb1-xBix)S Thin Films

Abstract

Nanocrystalline (Pb_1-xBi_x)S thin films were successfully deposited on suitably cleaned glass substrate at constant room temperature, using the chemical bath deposition technique. After deposition the films were also annealed at 400⁰C for 1 hour in air. The crystal structures of the films were determined by X-ray diffraction studies. The films are adherent to the substrate and well crystallized according to cubic structure with the preferential orientation (200). The crystallite size of the pure PbS thin films at optimized deposition time 30 min was found to be 40.4 nm, which increased with Bi content in pure nanocrystalline PbS thin films. The surface roughness of the films was measured by AFM studies. Experiments showed that the growth parameters, doping and annealing influenced the crystal structure of the films.

Key word: A. Thin films, B. Chemical synthesis C. Atomic force microscopy, D. X-ray diffraction

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